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The CpuStress tests perform device I/O testing with different processor utilization levels.
CpuStress
| Test | Description |
|---|---|
Device I/O with alternating processor utilization levels |
This test does device I/O testing while alternating between high (HPU) and low (LPU) processor utilization levels. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Device_IO_With_Varying_ProcUtil Parameters: - see Device Fundamentals Test Parameters DQ PingPongPeriod HPU LPU TestCycles |
Device I/O with a fixed processor utilization level |
This test does device I/O testing with the processor utilization (PU) level set to a fixed percentage. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Device_IO_With_Fixed_ProcUtil Parameters: - see Device Fundamentals Test Parameters DQ IOPeriod PU |
Device PNP with a fixed processor utilization level |
This test does device PNP testing with the processor utilization (PU) level set to a fixed percentage. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Device_PNP_With_Fixed_ProcUtil Parameters: - see Device Fundamentals Test Parameters DQ TestCycles PU |
Sleep with fixed processor utilization |
This test cycles the system through various sleep states with the processor utilization level set to a fixed percentage. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Sleep_With_Fixed_ProcUtil Parameters: - see Device Fundamentals Test Parameters TestCycles PU |
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How to select and configure the Device Fundamentals tests